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MX26LV040
Macronix NBit TM Memory Family 4M-BIT [512K x 8] CMOS SINGLE VOLTAGE 3V ONLY HIGH SPEED eLiteFlashTM MEMORY
FEATURES
* Extended single - supply voltage range 3.0V to 3.6V * 524,288 x 8 * Single power supply operation - 3.0V only operation for read, erase and program operation * Fast access time: 55/70ns * Low power consumption - 30mA maximum active current - 30uA typical standby current * Command register architecture - Byte Programming (55us typical) - Sector Erase (Sector structure 64K-Byte x8) * Auto Erase (chip & sector) and Auto Program - Automatically erase any combination of sectors with Erase Suspend capability. - Automatically program and verify data at specified address Status Reply - Data# polling & Toggle bit for detection of program and erase operation completion. 2,000 minimum erase/program cycles Latch-up protected to 100mA from -1V to VCC+1V Package type: - 32-pin PLCC - 32-pin TSOP - 32-pin PDIP Compatibility with JEDEC standard - Pinout and software compatible with single-power supply Flash 20 years data retention
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GENERAL DESCRIPTION
The MX26LV040 is a 4-mega bit Flash memory organized as 512K bytes of 8 bits. MXIC's Flash memories offer the most cost-effective and reliable read/write nonvolatile random access memory. The MX26LV040 is packaged in 32-pin PLCC, 32-pin TSOP and 32-pin PDIP. It is designed to be reprogrammed and erased in system or in standard EPROM programmers. The standard MX26LV040 offers access time as fast as 55ns, allowing operation of high-speed microprocessors without wait states. To eliminate bus contention, the MX26LV040 has separate chip enable (CE#) and output enable (OE#) controls. MXIC's Flash memories augment EPROM functionality with in-circuit electrical erasure and programming. The MX26LV040 uses a command register to manage this functionality. The command register allows for 100% TTL level control inputs and fixed power supply levels during erase and programming, while maintaining maximum EPROM compatibility. MXIC Flash technology reliably stores memory contents even after 2,000 erase and program cycles. The MXIC cell is designed to optimize the erase and programming mechanisms. In addition, the combination of advanced tunnel oxide processing and low internal electric fields for erase and program operations produces reliable cycling. The MX26LV040 uses a 3.0V~3.6V VCC supply to perform the High Reliability Erase and auto Program/ Erase algorithms. The highest degree of latch-up protection is achieved with MXIC's proprietary non-epi process. Latch-up protection is proved for stresses up to 100 milliamps on address and data pin from -1V to VCC + 1V.
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PIN CONFIGURATIONS 32 PLCC
WE# VCC A12 A15 A16 A18 A17
4 1 32 30 29
32 TSOP
A11 A9 A8 A13 A14 A17 WE# VCC A18 A16 A15 A12 A7 A6 A5 A4 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 OE# A10 CE# Q7 Q6 Q5 Q4 Q3 GND Q2 Q1 Q0 A0 A1 A2 A3
A7 A6 A5 A4 A3 A2 A1 A0 Q0
5
A14 A13 A8 A9
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25
A11 OE# A10 CE#
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13 14
17
21 20
Q7
Q1
Q2
GND
Q3
Q4
Q5
32 PDIP
A18 A16 A15 A12 A7 A6 A5 A4 A3 A2 A1 A0 Q0 Q1 Q2 GND 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 VCC WE# A17 A14 A13 A8 A9 A11 OE# A10 CE# Q7 Q6 Q5 Q4 Q3
Q6
Table 1. PIN DESCRIPTION
SYMBOL PIN NAME A0~A18 Q0~Q7 CE# WE# OE# VCC GND Address Input Data Input/Output Chip Enable Input Write Enable Input Output Enable Input Power Supply Pin (3.0V~3.6V) Ground Pin
BLOCK STRUCTURE Table 2. MX26LV040 SECTOR ARCHITECTURE
Sector SA0 SA1 SA2 SA3 SA4 SA5 SA6 SA7
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Sector Size Byte Mode 64Kbytes 64Kbytes 64Kbytes 64Kbytes 64Kbytes 64Kbytes 64Kbytes 32Kbytes
MX26LV040
Address range Byte Mode (x8) 00000-0FFFF 10000-1FFFF 20000-2FFFF 30000-3FFFF 40000-4FFFF 50000-5FFFF 60000-6FFFF 70000-7FFFF A18 A17 0 0 0 0 1 1 1 1 0 0 1 1 0 0 1 1
Sector Address A16 0 1 0 1 0 1 0 1 A15 X X X X X X X X A14 X X X X X X X X A13 X X X X X X X X
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BLOCK DIAGRAM
CE# OE# WE#
CONTROL INPUT LOGIC
PROGRAM/ERASE HIGH VOLTAGE
WRITE STATE MACHINE (WSM)
STATE REGISTER FLASH ARRAY
ARRAY SOURCE HV
X-DECODER
ADDRESS LATCH
A0-A18
AND BUFFER
Y-PASS GATE
COMMAND DATA DECODER
Y-DECODER
SENSE AMPLIFIER
PGM DATA HV
COMMAND DATA LATCH
PROGRAM DATA LATCH
Q0-Q7
I/O BUFFER
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AUTOMATIC PROGRAMMING
The MX26LV040 is byte programmable using the Automatic Programming algorithm. The Automatic Programming algorithm makes the external system do not need to have time out sequence nor to verify the data programmed. the device automatically times the erase pulse width, provides the erase verification, and counts the number of sequences. A status bit toggling between consecutive read cycles provides feedback to the user as to the status of the erasing operation. Register contents serve as inputs to an internal statemachine which controls the erase and programming circuitry. During write cycles, the command register internally latches address and data needed for the programming and erase operations. During a system write cycle, addresses are latched on the falling edge, and data are latched on the rising edge of WE# or CE#, whichever happens first. MXIC's Flash technology combines years of EPROM experience to produce the highest levels of quality, reliability, and cost effectiveness. The MX26LV040 electrically erases all bits simultaneously using FowlerNordheim tunneling. The bytes are programmed by using the EPROM programming mechanism of hot electron injection. During a program cycle, the state-machine will control the program sequences and command register will not respond to any command set. During a Sector Erase cycle, the command register will only respond to Erase Suspend command. After Erase Suspend is completed, the device stays in read mode. After the state machine has completed its task, it will allow the command register to respond to its full command set.
AUTOMATIC PROGRAMMING ALGORITHM
MXIC's Automatic Programming algorithm requires the user to only write program set-up commands (including 2 unlock write cycle and A0H) and a program command (program data and address). The device automatically times the programming pulse width, provides the program verification, and counts the number of sequences. A status bit similar to DATA# Polling and a status bit toggling between consecutive read cycles, provide feedback to the user as to the status of the programming operation. Refer to write operation status, table 7, for more information on these status bits.
AUTOMATIC CHIP ERASE
The entire chip is bulk erased using 10 ms erase pulses according to MXIC's Automatic Chip Erase algorithm. The Automatic Erase algorithm automatically programs the entire array prior to electrical erase. The timing and verification of electrical erase are controlled internally within the device.
AUTOMATIC SECTOR ERASE
The MX26LV040 is sector(s) erasable using MXIC's Auto Sector Erase algorithm. The Automatic Sector Erase algorithm automatically programs the specified sector(s) prior to electrical erase. The timing and verification of electrical erase are controlled internally within the device. An erase operation can erase one sector, multiple sectors, or the entire device.
AUTOMATIC SELECT
The auto select mode provides manufacturer and device identification, through identifier codes output on Q7~Q0. This mode is mainly adapted for programming equipment on the device to be programmed with its programming algorithm. When programming by high voltage method, automatic select mode requires VID (11V to 12V) on address pin A9 and other address pin A6, A1 and A0 as referring to Table 3. In addition, to access the automatic select codes in-system, the host can issue the automatic select command through the command register without requiring VID, as shown in table 4.
AUTOMATIC ERASE ALGORITHM
MXIC's Automatic Erase algorithm requires the user to write commands to the command register using standard microprocessor write timings. The device will automatically pre-program and verify the entire array. Then
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TABLE 3. MX26LV040 AUTO SELECT MODE OPERATION
A18 A12 Description Read Manufacturer Code CE# OE# WE# L L L L H H | X X | X X VID VID A13 A10 Silicon ID Device ID A9 A8 | A7 X X L L A6 A5 | A2 X X L L L H C2H 4FH A1 A0 Q7~Q0
NOTE:SA=Sector Address, X=Don't Care, L=Logic Low, H=Logic High
COMMAND DEFINITIONS
Device operations are selected by writing specific address and data sequences into the command register. Writing incorrect address and data values or writing them in the improper sequence will reset the device to the read mode. Table 4 defines the valid register command sequences. Note that the Erase Suspend (B0H) and Erase Resume (30H) commands are valid only while the Sector Erase operation is in progress.
TABLE 4. MX26LV040 COMMAND DEFINITIONS
First Bus Command Bus Cycle Cycle Addr Reset Read Read Silicon ID Program Chip Erase Sector Erase 1 1 4 4 6 6 Second Bus Cycle Data Addr Third Bus Cycle Data Addr Fourth Bus Cycle Data Addr Data Fifth Bus Cycle Addr Sixth Bus Cycle Data Addr Data
XXXH F0H RA RD 55H 55H 55H 55H 555H 555H 555H 555H 90H ADI A0H PA DDI PD 2AAH 55H 2AAH 55H 555H 10H SA 30H
555H AAH 2AAH 555H AAH 2AAH 555H AAH 2AAH 555H AAH 2AAH
80H 555H AAH 80H 555H AAH
Note: 1. ADI = Address of Device identifier; A1=0, A0 = 0 for manufacturer code,A1=0, A0 = 1 for device code. A2-A18=do not care. (Refer to table 3) DDI = Data of Device identifier : C2H for manufacture code, 4FH for device code. X = X can be VIL or VIH RA=Address of memory location to be read. RD=Data to be read at location RA. 2. PA = Address of memory location to be programmed. PD = Data to be programmed at location PA. SA = Address of the sector. 3. Address A18-A11 are don't cares for unlock and command cycles.
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TABLE 5. MX26LV040 BUS OPERATION
ADDRESS DESCRIPTION CE# OE# WE# A18 A12 A9 A13 A10 Write Reset Output Disable Standby NOTES: 1. Manufacturer and device codes may also be accessed via a command register write sequence. Refer to Table 4. 2. VID is the Silicon-ID-Read high voltage, 11V to 12V. 3. Refer to Table 4 for valid Data-In during a write operation. 4. X can be VIL or VIH. L X L Vcc0.3V H X H X L X H X A8 A7 AIN X X X A6 A5 A2 DIN(3) High Z High Z High Z A1 A0 Q0~Q7
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REQUIREMENTS FOR READING ARRAY DATA
To read array data from the outputs, the system must drive the CE# and OE# pins to VIL. CE# is the power control and selects the device. OE# is the output control and gates array data to the output pins. WE# should remain at VIH. The internal state machine is set for reading array data upon device power-up. This ensures that no spurious alteration of the memory content occurs during the power transition. No command is necessary in this mode to obtain array data. Standard microprocessor read cycles that assert valid address on the device address inputs produce valid data on the device data outputs. The device remains enabled for read access until the command register contents are altered. Characteristics" section contains timing specification table and timing diagrams for write operations.
STANDBY MODE
When using both pins of CE#, the device enter CMOS Standby with both pins held at Vcc 0.3V. If CE# is held at VIH, but not within the range of VCC 0.3V, the device will still be in the standby mode, but the standby current will be larger. During Auto Algorithm operation, Vcc active current (Icc2) is required even CE# = "H" until the operation is completed. The device can be read with standard access time (tCE) from either of these standby modes, before it is ready to read data.
OUTPUT DISABLE
With the OE# input at a logic high level (VIH), output from the devices are disabled. This will cause the output pins to be in a high impedance state.
WRITE COMMANDS/COMMAND SEQUENCES
To program data to the device or erase sectors of memory , the system must drive WE# and CE# to VIL, and OE# to VIH. The "Byte Program Command Sequence" section has details on programming data to the device. An erase operation can erase one sector, multiple sectors , or the entire device. Table indicates the address space that each sector occupies. A "sector address" consists of the address bits required to uniquely select a sector. The "Writing specific address and data commands or sequences into the command register initiates device operations. Table 1 defines the valid register command sequences. Writing incorrect address and data values or writing them in the improper sequence resets the device to reading array data. Section has details on erasing a sector or the entire chip, or suspending/resuming the erase operation. After the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the internal register (which is separate from the memory array) on Q7-Q0. Standard read cycle timings apply in this mode. Refer to the Autoselect Mode and Autoselect Command Sequence section for more information. ICC2 in the DC Characteristics table represents the active current specification for the write mode. The "AC
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READ COMMAND
The read operation is initiated by writing the read command sequence into the command register. Microprocessor read cycles retrieve array data. The device remains enabled for reads until the command register contents are altered. If program-fail or erase-fail happen, the write of F0H will reset the device to abort the operation. A valid command must then be written to place the device in the desired state.
SILICON-ID READ COMMAND
Flash memories are intended for use in applications where the local CPU alters memory contents. As such, manufacturer and device codes must be accessible while the device resides in the target system. PROM programmers typically access signature codes by raising A9 to a high voltage (VID). However, multiplexing high voltage onto address lines is not generally desired system design practice. The MX26LV040 contains a Silicon-ID-Read operation to supple traditional PROM programming methodology. The operation is initiated by writing the read silicon ID comREV. 1.0, NOV. 08, 2004
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mand sequence into the command register.
SET-UP AUTOMATIC CHIP/SECTOR ERASE COMMANDS
Chip erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the "set-up" command 80H. Two more "unlock" write cycles are then followed by the chip erase command 10H or sector erase command 30H. The Automatic Chip Erase does not require the device to be entirely pre-programmed prior to executing the Automatic Chip Erase. Upon executing the Automatic Chip Erase, the device will automatically program and verify the entire memory for an all-zero data pattern. When the device is automatically verified to contain an all-zero pattern, a self-timed chip erase and verify begin. The erase and verify operations are completed when the data on Q7 is "1" at which time the device returns to the Read mode. The system is not required to provide any control or timing during these operations. When using the Automatic Chip Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array (no erase verification command is required). If the Erase operation was unsuccessful, the data on Q5 is "1"(see Table 7), indicating the erase operation exceed internal timing limit. The automatic erase begins on the rising edge of the last WE# or CE# pulse, whichever happens first in the command sequence and terminates when the data on Q7 is "1" and the data on Q6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode.
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TABLE 6. SILICON ID CODE
Pins Manufacture code Device code A0 VIL VIH A1 VIL VIL Q7 1 0 Q6 1 1 Q5 0 0 Q4 0 0 Q3 0 1 Q2 0 1 Q1 1 1 Q0 0 1 Code(Hex) C2H 4FH
READING ARRAY DATA
The device is automatically set to reading array data after device power-up. No commands are required to retrieve data. The device is also ready to read array data after completing an Automatic Program or Automatic Erase algorithm. After the device accepts an Erase Suspend command, the device enters the Erase Suspend mode. The system can read array data using the standard read timings, except that if it reads at an address within erasesuspended sectors, the device outputs status data. After completing a programming operation in the Erase Suspend mode, the system may once again read array data with the same exception. See erase Suspend/Erase Resume Commands for more information on this mode. The system must issue the reset command to re-enable the device for reading array data if Q5 goes high, or while in the autoselect mode. See the "Reset Command" section, next.
sequence. Once in the SILICON ID READ mode, the reset command must be written to return to reading array data (also applies to SILICON ID READ during Erase Suspend). If Q5 goes high during a program or erase operation, writing the reset command returns the device to reading array data (also applies during Erase Suspend).
SECTOR ERASE COMMANDS
The Automatic Sector Erase does not require the device to be entirely pre-programmed prior to executing the Automatic Sector Erase Set-up command and Automatic Sector Erase command. Upon executing the Automatic Sector Erase command, the device will automatically program and verify the sector(s) memory for an all-zero data pattern. The system is not required to provide any control or timing during these operations. When the sector(s) is automatically verified to contain an all-zero pattern, a self-timed sector erase and verify begin. The erase and verify operations are complete when the data on Q7 is "1" and the data on Q6 stops toggling for two consecutive read cycles, at which time the device returns to the Read mode. The system is not required to provide any control or timing during these ope r a t i on s . When using the Automatic sector Erase algorithm, note that the erase automatically terminates when adequate erase margin has been achieved for the memory array (no erase verification command is required). Sector erase is a six-bus cycle operation. There are two "unlock" write cycles. These are followed by writing the set-up command 80H. Two more "unlock" write cycles are then followed by the sector erase command 30H. The sector address is latched on the falling edge of WE# or CE#, whichever happens later, while the command (data) is latched on the rising edge of WE# or CE#, whichever happens first. Sector addresses selected are loaded into internal register on the sixth falling edge of WE# or
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RESET COMMAND
Writing the reset command to the device resets the device to reading array data. Address bits are don't care for this command. The reset command may be written between the sequence cycles in an erase command sequence before erasing begins. This resets the device to reading array data. Once erasure begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in a program command sequence be-fore programming begins. This resets the device to reading array data (also applies to programming in Erase Suspend mode). Once programming begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in an SILICON ID READ command
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CE#, whichever happens later. Each successive sector load cycle started by the falling edge of WE# or CE#, whichever happens later must begin within 50us from the rising edge of the preceding WE# or CE#, whichever happens first. Otherwise, the loading period ends and internal auto sector erase cycle starts. (Monitor Q3 to determine if the sector erase timer window is still open, see section Q3, Sector Erase Timer.) Any command other than Sector Erase(30H) or Erase Suspend(B0H) during the time-out period resets the device to read mode. tus of a write operation: Q2, Q3, Q5, Q6, Q7. Table 7 and the following subsections describe the functions of these bits. Q7 and Q6 each offer a method for determining whether a program or erase operation is complete or in progress. These three bits are discussed first.
Q7: Data# Polling
The Data# Polling bit, Q7, indicates to the host system whether an Automatic Algorithm is in progress or completed, or whether the device is in Erase Suspend. Data# Polling is valid after the rising edge of the final WE# pulse in the program or erase command sequence. During the Automatic Program algorithm, the device outputs on Q7 the complement of the datum programmed to Q7. This Q7 status also applies to programming during Erase Suspend. When the Automatic Program algorithm is complete, the device outputs the datum programmed to Q7. The system must provide the program address to read valid status information on Q7. During the Automatic Erase algorithm, Data# Polling produces a "0" on Q7. When the Automatic Erase algorithm is complete, or if the device enters the Erase Suspend mode, Data# Polling produces a "1" on Q7. This is analogous to the complement/true datum out-put described for the Automatic Program algorithm: the erase function changes all the bits in a sector to "1" prior to this, the device outputs the "complement," or "0". The system must provide an address within any of the sectors selected for erasure to read valid status information on Q7. When the system detects Q7 has changed from the complement to true data, it can read valid data at Q7-Q0 on the following read cycles. This is because Q7 may change asynchronously with Q0-Q6 while Output Enable (OE#) is asserted low.
BYTE PROGRAM COMMAND SEQUENCE
The device programs one byte of data for each program operation. The command sequence requires four bus cycles, and is initiated by writing two unlock write cycles, followed by the program set-up command. The program address and data are written next, which in turn initiate the Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically generates the program pulses and verifies the programmed cell margin. Table 1 shows the address and data requirements for the byte program command sequence. When the Embedded Program algorithm is complete, the device then returns to reading array data and addresses are no longer latched. The system can determine the status of the program operation by using Q7, Q6. See "Write Operation Status" for information on these status bits. Any commands written to the device during the Embedded Program Algorithm are ignored. Note that a hardware reset immediately terminates the programming operation. The Byte Program command sequence should be reinitiated once the device has reset to reading array data, to ensure data integrity. Programming is allowed in any sequence and across sector boundaries. A bit cannot be programmed from a "0" back to a "1". Attempting to do so may halt the operation and set Q5 to "1" or cause the Data# Polling algorithm to indicate the operation was successful. However, a succeeding read will show that the data is still "0". Only erase operations can convert a "0" to a "1".
Q6:Toggle BIT I
Toggle Bit I on Q6 indicates whether an Automatic Program or Erase algorithm is in progress or complete. Toggle Bit I may be read at any address, and is valid after the rising edge of the final WE# or CE#, whichever happens first, in the command sequence (prior to the program or erase operation), and during the sector time-out. During an Automatic Program or Erase algorithm operation, successive read cycles to any address cause Q6 to toggle. The system may use either OE# or CE# to
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WRITE OPERATION STATUS
The device provides several bits to determine the staP/N:PM1118
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control the read cycles. When the operation is complete, Q6 stops toggling. When the device is actively erasing (that is, the Automatic Erase algorithm is in progress), Q6 toggling. However, the system must also use Q2 to determine which sectors are erasing. Alternatively, the system can use Q7. Q6 stops toggling once the Automatic Program algorithm is complete. Table 7 shows the outputs for Toggle Bit I on Q6. the toggle bit may have stopped toggling just as Q5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that system initially determines that the toggle bit is toggling and Q5 has not gone high. The system may continue to monitor the toggle bit and Q5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation.
Q2:Toggle Bit II
The "Toggle Bit II" on Q2, when used with Q6, indicates whether a particular sector is actively erasing (that is, the Automatic Erase algorithm is in process), or whether that sector is erase-suspended. Toggle Bit II is valid after the rising edge of the final WE# or CE#, whichever happens first, in the command sequence. Q2 toggles when the system reads at addresses within those sectors that have been selected for erasure. (The system may use either OE# or CE# to control the read cycles.) But Q2 cannot distinguish whether the sector is actively erasing or is erase-suspended. Q6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sectors and mode information. Refer to Table 7 to compare outputs for Q2 and Q6.
Q5: Exceeded Timing Limits
Q5 will indicate if the program or erase time has exceeded the specified limits (internal pulse count). Under these conditions Q5 will produce a "1". This time-out condition indicates that the program or erase cycle was not successfully completed. Data# Polling and Toggle Bit are the only operating functions of the device under this condition. If this time-out condition occurs during sector erase operation, it specifies that a particular sector is bad and it may not be reused. However, other sectors are still functional and may be used for the program or erase operation. The device must be reset to use other sectors. Write the Reset command sequence to the device, and then execute program or erase command sequence. This allows the system to continue to use the other active sectors in the device. If this time-out condition occurs during the chip erase operation, it specifies that the entire chip is bad or combination of sectors are bad. If this time-out condition occurs during the byte programming operation, it specifies that the entire sector containing that byte is bad and this sector maynot be reused, (other sectors are still functional and can be reused). The time-out condition will not appear if a user tries to program a non blank location without erasing. Please note that this is not a device failure condition since the device was incorrectly used.
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Reading Toggle Bits Q6/ Q2
Whenever the system initially begins reading toggle bit status, it must read Q7-Q0 at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on Q7-Q0 on the following read cycle. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of Q5 is high (see the section on Q5). If it is, the system should then determine again whether the toggle bit is toggling, since
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Table 7. WRITE OPERATION STATUS
Status Q7 (Note1) In Progress Exceeded Time Limits Byte Program in Auto Program Algorithm Auto Erase Algorithm Byte Program in Auto Program Algorithm Auto Erase Algorithm Q7# 0 Q7# 0 Toggle Toggle Toggle Toggle Q6 Q5 (Note2) 0 0 1 1 N/A 1 N/A 1 No Toggle Toggle No Toggle Toggle Q3 Q2
Note: 1. Q7 and Q2 require a valid address when reading status information. Refer to the appropriate subsection for further details. 2. Q5 switches to '1' when an Auto Program or Auto Erase operation has exceeded the maximum timing limits. See "Q5 : Exceeded Timing Limits" for more information.
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Q3 Sector Erase Timer
After the completion of the initial sector erase command sequence, the sector erase time-out will begin. Q3 will remain low until the time-out is complete. Data# Polling and Toggle Bit are valid after the initial sector erase command sequence. If Data# Polling or the Toggle Bit indicates the device has been written with a valid erase command, Q3 may be used to determine if the sector erase timer window is still open. If Q3 is high ("1") the internally controlled erase cycle has begun; attempts to write subsequent commands to the device will be ignored until the erase operation is completed as indicated by Data# Polling or Toggle Bit. If Q3 is low ("0"), the device will accept additional sector erase commands. To insure the command has been accepted, the system software should check the status of Q3 prior to and following each subsequent sector erase command. If Q3 were high on the second status check, the command may not have been accepted. POWER SUPPLY DECOUPLING In order to reduce power switching effect, each device should have a 0.1uF ceramic capacitor connected between its VCC and GND.
POWER-UP SEQUENCE
The MX26LV040 powers up in the Read only mode. In addition, the memory contents may only be altered after successful completion of the predefined command sequences.
DATA PROTECTION
The MX26LV040 is designed to offer protection against accidental erasure or programming caused by spurious system level signals that may exist during power transition. During power up the device automatically resets the state machine in the Read mode. In addition, with its control register architecture, alteration of the memory contents only occurs after successful completion of specific command sequences. The device also incorporates several features to prevent inadvertent write cycles resulting from VCC power-up and power-down transition or system noise.
WRITE PULSE "GLITCH" PROTECTION
Noise pulses of less than 5ns(typical) on CE# or WE# will not initiate a write cycle.
LOGICAL INHIBIT
Writing is inhibited by holding any one of OE# = VIL, CE# = VIH or WE# = VIH. To initiate a write cycle CE# and WE# must be a logical zero while OE# is a logical one.
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MX26LV040
ABSOLUTE MAXIMUM RATINGS
Storage Temperature Plastic Packages . . . . . . . . . . . . . ..... -65oC to +150oC Ambient Temperature with Power Applied. . . . . . . . . . . . . .... -65oC to +125oC Voltage with Respect to Ground VCC (Note 1) . . . . . . . . . . . . . . . . . -0.5 V to +4.0 V A9 and OE# (Note 2) . . . . . . . . . . . -0.5 V to +12 V All other pins (Note 1) . . . . . . . -0.5 V to VCC +0.5 V Output Short Circuit Current (Note 3) . . . . . . 200 mA Notes: 1. Minimum DC voltage on input or I/O pins is -0.5 V. During voltage transitions, input or I/O pins may overshoot VSS to -2.0 V for periods of up to 20 ns. Maximum DC voltage on input or I/O pins is VCC +0.5 V. During voltage transitions, input or I/O pins may overshoot to VCC +2.0 V for periods up to 20 ns. 2. Minimum DC input voltage on pins A9 and OE# is -0.5V. During voltage transitions, A9 and OE# may overshoot VSS to -2.0 V for periods of up to 20 ns. Maximum DC input voltage on pin A9 is +12V which may overshoot to 13.5V for periods up to 20 ns. 3. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than one second. Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability.
OPERATING RATINGS
Commercial (C) Devices Ambient Temperature (TA ). . . . . . . . . . . . 0 C to +70 C VCC Supply Voltages VCC for full voltage range. . . . . . . . . . . +3.0 V to 3.6 V
Operating ranges define those limits between which the functionality of the device is guaranteed.
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CAPACITANCE TA = 25oC, f = 1.0 MHz
SYMBOL CIN1 CIN2 COUT PARAMETER Input Capacitance Control Pin Capacitance Output Capacitance MIN. TYP MAX. 8 12 12 UNIT pF pF pF CONDITIONS VIN = 0V VIN = 0V VOUT = 0V
Table 8. DC CHARACTERISTICS TA = 0oC to 70oC, VCC = 3.0V ~ 3.6V
Symbol PARAMETER ILI ILIT ILO Input Leakage Current A9 Input Leakage Current Output Leakage Current MIN. TYP MAX. 1 100 1 UNIT uA uA uA CONDITIONS VIN = VSS to VCC VCC=VCC max; A9=12V VOUT = VSS to VCC, VCC = VCC max ICC1 VCC Active Read Current 20 8 ICC2 ICC3 VIL VIH VID VCC Active write Current VCC Standby Current Input Low Voltage (Note 1) Input High Voltage Voltage for Automative Select VOL VOH1 VOH2 Output Low Voltage Output High Voltage(TTL) Output High Voltage (CMOS) NOTES: 1. VIL min. = -1.0V for pulse width is equal to or less than 50 ns. VIL min. = -2.0V for pulse width is equal to or less than 20 ns. 2. VIH max. = VCC + 1.5V for pulse width is equal to or less than 20 ns If VIH is over the specified maximum value, read operation cannot be guaranteed. 3. Automatic sleep mode enable the low power mode when addresses remain stable for tACC +30ns. 0.85xVCC VCC-0.4 0.45 V IOL = 4.0mA, VCC = VCC min IOH = -2mA, VCC =VCC min IOH = -100uA, VCC min -0.5 0.7xVCC 11 26 30 30 14 30 100 0.8 VCC+ 0.3 12 mA mA mA uA V V V VCC=3.3V CE#=VIL, OE#=VIH @5MHz @1MHz
CE#=VIL, OE#=VIH
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AC CHARACTERISTICS TA = 0oC to 70oC, VCC = 3.0V~3.6V Table 9. READ OPERATIONS
26LV040-55 SYMBOL PARAMETER tRC tACC tCE tOE tDF tOEH Read Cycle Time (Note 1) Address to Output Delay CE# to Output Delay OE# to Output Delay OE# High to Output Float (Note1) Output Enable Read Hold Time tOH Toggle and Data# Polling 0 0 10 0 MIN. 55 55 55 25 25 0 0 10 0 MAX. 26LV040-70 MIN. 70 70 70 30 30 MAX. UNIT CONDITIONS ns ns ns ns ns ns ns ns CE#=OE#=VIL CE#=OE#=VIL OE#=VIL CE#=VIL CE#=VIL
Address to Output hold
TEST CONDITIONS:
* Input pulse levels: 0V/3.0V. * Input rise and fall times is equal to or less than 5ns. * Output load: 1 TTL gate + 100pF (Including scope and jig), for 26LV040-70. 1 TTL gate + 30pF (Including scope and jig) for 26LV040-55. * Reference levels for measuring timing: 1.5V.
NOTE:
1. Not 100% tested. 2. tDF is defined as the time at which the output achieves the open circuit condition and data is no longer driven.
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SWITCHING TEST CIRCUITS
DEVICE UNDER TEST
2.7K ohm +3.3V
CL
6.2K ohm
DIODES=IN3064 OR EQUIVALENT
CL=100pF Including jig capacitance for MX26LV040-70 (30pF for MX26LV040-55)
SWITCHING TEST WAVEFORMS
3.0V INPUT 0V 1.5V TEST POINTS 1.5V
OUTPUT
AC TESTING: Inputs are driven at 3.0V for a logic "1" and 0V for a logic "0". Input pulse rise and fall times are < 5ns.
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Figure 1. READ TIMING WAVEFORMS
tRC VIH
Addresses
VIL
ADD Valid
tACC tCE
CE#
VIH VIL
WE#
VIH VIL tOEH VIH
tOE
tDF
OE#
VIL tACC tOH
Outputs
VOH VOL
HIGH Z
DATA Valid
HIGH Z
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AC CHARACTERISTICS TA = 0oC to 70oC, VCC = 3.0V~3.6V Table 10. Erase/Program Operations
26LV040-55 SYMBOL tWC tAS tAH tDS tDH tOES tGHWL tCS tCH tWP tWPH tWHWH1 tWHWH2 tVCS tBAL PARAMETER Write Cycle Time (Note 1) Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recovery Time Before Write (OE# High to WE# Low) CE# Setup Time CE# Hold Time Write Pulse Width Write Pulse Width High Programming Operation (Note 2) Sector Erase Operation (Note 2) VCC Setup Time (Note 1) Sector Address Load Time 0 0 35 30 55 (typ.) 2.4 (typ.) 50 50 0 0 35 30 55 (typ.) 2.4 (typ.) 50 50 ns ns ns ns us sec us us MIN. 55 0 45 35 0 0 0 MAX. 26LV040-70 MIN. 70 0 45 35 0 0 0 MAX. UNIT ns ns ns ns ns ns ns
NOTES: 1. Not 100% tested. 2. See the "Erase and Programming Performance" section for more information.
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AC CHARACTERISTICS TA = 0oC to 70oC, VCC = 3.0V~3.6V Table 11. Alternate CE# Controlled Erase/Program Operations
26LV040-55 SYMBOL tWC tAS tAH tDS tDH tOES tGHEL tWS tWH tCP tCPH tWHWH1 tWHWH2
NOTE:
26LV040-70 MIN. 70 0 45 45 0 0 0 0 0 35 30 55(Typ.) 2.4(Typ.) MAX. UNIT ns ns ns ns ns ns ns ns ns ns ns us sec
PARAMETER Write Cycle Time (Note 1) Address Setup Time Address Hold Time Data Setup Time Data Hold Time Output Enable Setup Time Read Recovery Time Before Write WE# Setup Time WE# Hold Time CE# Pulse Width CE# Pulse Width High Programming Operation(note2) Sector Erase Operation (note2)
MIN. 55 0 45 35 0 0 0 0 0 35 30 55(Typ.) 2.4(Typ.)
MAX.
1. Not 100% tested. 2. See the "Erase and Programming Performance" section for more information.
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Figure 2. COMMAND WRITE TIMING WAVEFORM
VCC
3V
Addresses
VIH
ADD Valid
VIL tAS tAH
WE#
VIH VIL tOES tWPH tCWC
tWP
CE#
VIH VIL tCS tCH
OE#
VIH VIL VIH tDS tDH
Data
VIL
DIN
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AUTOMATIC PROGRAMMING TIMING WAVEFORM
One byte data is programmed. Verify in fast algorithm and additional verification by external control are not required because these operations are executed automatically by internal control circuit. Programming completion can be verified by DATA# polling and toggle bit checking after automatic programming starts. Device outputs DATA# during programming and DATA# after programming on Q7.(Q6 is for toggle bit; see toggle bit, DATA# polling, timing waveform)
Figure 3. AUTOMATIC PROGRAMMING TIMING WAVEFORM
Program Command Sequence(last two cycle)
tWC tAS
Read Status Data (last two cycle)
Address
555h
PA
tAH
PA
PA
CE#
tCH tGHWL
OE#
tWP
tWHWH1
WE#
tCS tDS tDH
tWPH
A0h Data
PD
Status
DOUT
tVCS
VCC
NOTES: 1.PA=Program Address, PD=Program Data, DOUT is the true data the program address
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Figure 4. AUTOMATIC PROGRAMMING ALGORITHM FLOWCHART
START
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Data A0H Address 555H
Write Program Data/Address
Increment Address
Data# Polling from system
No Verify Byte Ok ?
YES
No Last Address ?
YES
Auto Program Completed
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Figure 5. CE# CONTROLLED PROGRAM TIMING WAVEFORM
555 for program 2AA for erase
PA for program SA for sector erase 555 for chip erase
Data# Polling
Address
tWC tWH tAS tAH
PA
WE#
tGHEL
OE#
tCP tWHWH1 or 2
CE#
tWS tDS tDH
tCPH
Q7
DOUT
Data
A0 for program 55 for erase
PD for program 30 for sector erase 10 for chip erase
NOTES: 1. PA=Program Address, PD=Program Data, DOUT=Data Out, Q7=complement of data written to device. 2. Figure indicates the last two bus cycles of the command sequence.
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AUTOMATIC CHIP ERASE TIMING WAVEFORM
All data in chip are erased. External erase verification is not required because data is verified automatically by internal control circuit. Erasure completion can be verified by DATA# polling and toggle bit checking after automatic erase starts. Device outputs 0 during erasure and 1 after erasure on Q7.(Q6 is for toggle bit; see toggle bit, DATA# polling, timing waveform)
Figure 6. AUTOMATIC CHIP ERASE TIMING WAVEFORM
Erase Command Sequence(last two cycle)
tWC tAS
Read Status Data
Address
2AAh
555h
tAH
VA
VA
CE#
tCH tGHWL
OE#
tWP
tWHWH2
WE#
tCS tDS tDH
tWPH
55h Data
tVCS
10h
In Progress Complete
VCC
NOTES: SA=sector address(for Sector Erase), VA=Valid Address for reading status data(see "Write Operation Status").
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Figure 7. AUTOMATIC CHIP ERASE ALGORITHM FLOWCHART
START
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Data 80H Address 555H
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Data 10H Address 555H
Data Pall from System
NO
Data=FFh ?
YES
Auto Chip Erase Completed
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MX26LV040
AUTOMATIC SECTOR ERASE TIMING WAVEFORM
Sector indicated by A12 to A18 are erased. External erase verify is not required because data are verified automatically by internal control circuit. Erasure completion can be verified by DATA# polling and toggle bit checking after automatic erase starts. Device outputs 0 during erasure and 1 after erasure on Q7.(Q6 is for toggle bit; see toggle bit, DATA# polling, timing waveform)
Figure 8. AUTOMATIC SECTOR ERASE TIMING WAVEFORM
Erase Command Sequence(last two cycle)
tWC tAS
Read Status Data
Address
2AAh
Sector Address 0
tAH
Sector Address 1
Sector Address n
VA
VA
CE#
tCH tGHWL
OE#
tBAL tWHWH2
tWP
WE#
tCS tDS tDH
tWPH
55h Data
tVCS
30h
30h
30h
In Progress Complete
VCC
NOTES: SA=sector address(for Sector Erase), VA=Valid Address for reading status data(see "Write Operation Status").
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Figure 9. AUTOMATIC SECTOR ERASE ALGORITHM FLOWCHART
START
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Data 80H Address 555H
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Data 30H Sector Address
Last Sector to Erase YES Data Poll from System
NO
Data=FFh
NO
YES
Auto Sector Erase Completed
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WRITE OPERATION STATUS Figure 10. DATA# POLLING ALGORITHM
Start
Read Q7~Q0 Add.=VA(1)
Q7 = Data ?
Yes
No No
Q5 = 1 ?
Yes Read Q7~Q0 Add.=VA
Q7 = Data ? (2) No FAIL
Yes
Pass
NOTE : 1.VA=Valid address for programming 2.Q7 should be re-checked even Q5="1" because Q7 may change simultaneously with Q5.
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Figure 11. TOGGLE BIT ALGORITHM
Start
Read Q7-Q0
Read Q7-Q0
(Note 1)
Toggle Bit Q6 = Toggle ?
NO
YES
NO Q5= 1?
YES
Read Q7~Q0 Twice
(Note 1,2)
Toggle bit Q6= Toggle?
NO
YES
Program/Erase Operation Not Complete,Write Reset Command
Program/Erase operation Complete
Note:1.Read toggle bit twice to determine whether or not it is toggling. 2. Recheck toggle bit because it may stop toggling as Q5 change to "1".
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Figure 12. DATA# POLLING TIMINGS (During Automatic Algorithms)
tRC
Address
VA
tACC tCE
VA
VA
CE#
tCH tOE
OE#
tOEH tDF
WE#
tOH
Q7
Complement
Complement
True
Valid Data
High Z
Q0-Q6
Status Data
Status Data
True
Valid Data
High Z
NOTES: 1. VA=Valid address. Figure shows are first status cycle after command sequence, last status read cycle, and array data read cycle. 2. CE# must be toggled when DATA# polling.
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Figure 13. TOGGLE BIT TIMINGS (During Automatic Algorithms)
tRC
Address
VA
tACC tCE
VA
VA
VA
CE#
tCH tOE
OE#
tOEH tDF
WE#
tOH
Q6/Q2
High Z
Valid Status (first raed)
Valid Status (second read)
Valid Data (stops toggling)
Valid Data
NOTES: 1. VA=Valid address; not required for Q6. Figure shows first two status cycle after command sequence, last status read cycle, and array data read cycle. 2. CE# must be toggled when toggle bit toggling.
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Figure 14. ID CODE READ TIMING WAVEFORM
VCC
3V VID
ADD A9
VIH VIL
VIH VIL
ADD A0
tACC VIH
tACC
A1
VIL
ADD A2-A8 A10-A18 CE#
VIH VIL
VIH VIL
WE#
VIH VIL
tCE
OE#
VIH VIL
tOE tDF tOH tOH
VIH
DATA Q0-Q7
DATA OUT
VIL
DATA OUT B5H/B6H
C2H
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ERASE AND PROGRAMMING PERFORMANCE(1)
LIMITS PARAMETER Sector Erase Time Chip Erase Time Byte Programming Time Chip Programming Time Erase/Program Cycles 2K (6) MIN. TYP.(2) 2.4 20 55 18 MAX.(3) 15 80 220 36 UNITS sec sec us sec Cycles
Note: 1. Not 100% tested. 2. Typical program and erase times assume the following conditions : 25 C, 3.3V VCC. Programming spec. assume that all bits are programmed to checkerboard pattern. 3. Maximum values are measured at VCC=3.0V, worst case temperature. Maximum values are up to including 2K program/erase cycles. 4. System-level overhead is the time required to execute the command sequences for the all program command. 5. Excludes 00H programming prior to erasure. (In the pre-programming step of the embedded erase algorithm, all bits are programmed to 00H before erasure) 6. Min. erase/program cycles is under : 3.3V VCC, 25 C, checkerboard pattern conditions, and without baking process.
LATCH-UP CHARACTERISTICS
MIN. Input Voltage with respect to GND on ACC, OE#, A9 Input Voltage with respect to GND on all power pins, Address pins, CE# and WE# Input Voltage with respect to GND on all I/O pins Current Includes all pins except VCC. Test conditions: VCC = 3.0V, one pin at a time. -1.0V -1.0V -1.0V -100mA MAX. 12V VCC + 1.0V VCC + 1.0V +100mA
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MX26LV040
ORDERING INFORMATION PLASTIC PACKAGE
PART NO. Access Time(ns) MX26LV040QC-55 MX26LV040QC-70 MX26LV040TC-55 MX26LV040TC-70 MX26LV040PC-55 MX26LV040PC-70 MX26LV040QC-55G MX26LV040QC-70G MX26LV040TC-55G MX26LV040TC-70G MX26LV040PC-55G MX26LV040PC-70G 55 70 55 70 55 70 55 70 55 70 55 70 Operating Current MAX.(mA) 30 30 30 30 30 30 30 30 30 30 30 30 Standby Current MAX.(uA) 100 100 100 100 100 100 100 100 100 100 100 100 32 Pin PLCC 32 Pin PLCC 32 Pin TSOP 32 Pin TSOP 32 Pin PDIP 32 Pin PDIP 32 Pin PLCC 32 Pin PLCC 32 Pin TSOP 32 Pin TSOP 32 Pin PDIP 32 Pin PDIP Pb-free Pb-free Pb-free Pb-free Pb-free Pb-free Package Remark
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PACKAGE INFORMATION
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REVISION HISTORY
Revision No. Description 1.0 1. Removed "Preliminary" 2. To added 32-pin PDIP package information Page P1 All Date NOV/08/2004
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MACRONIX INTERNATIONAL CO., LTD.
Headquarters:
TEL:+886-3-578-6688 FAX:+886-3-563-2888
Europe Office :
TEL:+32-2-456-8020 FAX:+32-2-456-8021
Hong Kong Office :
TEL:+86-755-834-335-79 FAX:+86-755-834-380-78
Japan Office :
Kawasaki Office :
TEL:+81-44-246-9100 FAX:+81-44-246-9105
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TEL:+81-6-4807-5460 FAX:+81-6-4807-5461
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TEL:+65-6346-5505 FAX:+65-6348-8096
Taipei Office :
TEL:+886-2-2509-3300 FAX:+886-2-2509-2200
MACRONIX AMERICA, INC.
TEL:+1-408-262-8887 FAX:+1-408-262-8810
http : //www.macronix.com
MACRONIX INTERNATIONAL CO., LTD. reserves the right to change product and specifications without notice.

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